This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Automated Diagnosis in Testing and Failure Analysis
July-September 1997 (vol. 14 no. 3)
pp. 83-89
In order to meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming a requirement. The use of these techniques affects many parts of the product design and manufacturing processes. This paper describes the development and deployment of an automated diagnosis methodology within Texas Instruments.
Citation:
Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena, "Automated Diagnosis in Testing and Failure Analysis," IEEE Design & Test of Computers, vol. 14, no. 3, pp. 83-89, July-Sept. 1997, doi:10.1109/54.606003
Usage of this product signifies your acceptance of the Terms of Use.