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Issue No.03 - July-September (1997 vol.14)
pp: 83-89
ABSTRACT
In order to meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming a requirement. The use of these techniques affects many parts of the product design and manufacturing processes. This paper describes the development and deployment of an automated diagnosis methodology within Texas Instruments.
CITATION
Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena, "Automated Diagnosis in Testing and Failure Analysis", IEEE Design & Test of Computers, vol.14, no. 3, pp. 83-89, July-September 1997, doi:10.1109/54.606003
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