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Issue No.03 - July-September (1997 vol.14)
pp: 76-82
ABSTRACT
This paper reviews the logic failure analysis process and emphasizes the critical need for fault localization using software-based diagnostics. Continuous improvements in yield, reliability, time- to-market, and customer satisfaction all depend on quick corrective-action implementation through root cause failure analysis. Fault localization is the first and most critical step in the failure analysis process. This paper reviews the two primary localization methods: software-based diagnostics such as scan, and hardware diagnostics adapted to the back side of the die. Software diagnostics are emphasized as the method of choice with hardware diagnostics limited to a complementary role because of reduced coverage of defect types.
INDEX TERMS
failure analysis, software-based diagnostics, fault localization, VLSI, scan
CITATION
David P. Vallett, "IC Failure Analysis: The Importance of Test and Diagnostics", IEEE Design & Test of Computers, vol.14, no. 3, pp. 76-82, July-September 1997, doi:10.1109/54.606001
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