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Issue No.03 - July-September (1997 vol.14)
pp: 70-75
ABSTRACT
<p>Failure analysts no longer can wait till defective products come back from the field. Today, they must take a proactive role, detecting failures before they occur and helping designers eliminate their causes.</p>
CITATION
Donald Staab, Eugene R. Hnatek, "Diagnosing IC Failures in a Fast Environment", IEEE Design & Test of Computers, vol.14, no. 3, pp. 70-75, July-September 1997, doi:10.1109/54.606000
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