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Diagnosing IC Failures in a Fast Environment
July-September 1997 (vol. 14 no. 3)
pp. 70-75

Failure analysts no longer can wait till defective products come back from the field. Today, they must take a proactive role, detecting failures before they occur and helping designers eliminate their causes.

Citation:
Donald Staab, Eugene R. Hnatek, "Diagnosing IC Failures in a Fast Environment," IEEE Design & Test of Computers, vol. 14, no. 3, pp. 70-75, July-Sept. 1997, doi:10.1109/54.606000
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