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IC Failure Analysis: Magic, Mystery, and Science
July-September 1997 (vol. 14 no. 3)
pp. 59-69
| ASCII Text | x | ||
| Jerry M. Soden, Richard E. Anderson, Chris L. Henderson, "IC Failure Analysis: Magic, Mystery, and Science," IEEE Design & Test of Computers, vol. 14, no. 3, pp. 59-69, July-September, 1997. | |||
| BibTex | x | ||
| @article{ 10.1109/54.605998, author = {Jerry M. Soden and Richard E. Anderson and Chris L. Henderson}, title = {IC Failure Analysis: Magic, Mystery, and Science}, journal ={IEEE Design & Test of Computers}, volume = {14}, number = {3}, issn = {0740-7475}, year = {1997}, pages = {59-69}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.605998}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - IC Failure Analysis: Magic, Mystery, and Science IS - 3 SN - 0740-7475 SP59 EP69 EPD - 59-69 A1 - Jerry M. Soden, A1 - Richard E. Anderson, A1 - Chris L. Henderson, PY - 1997 VL - 14 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.605998
Advancing IC and packaging technologies motivate and direct the future of failure analysis. The authors review current tools and techniques and discuss challenges and opportunities created by the industry's critical need for new diagnosis and failure analysis paradigms.
Citation:
Jerry M. Soden, Richard E. Anderson, Chris L. Henderson, "IC Failure Analysis: Magic, Mystery, and Science," IEEE Design & Test of Computers, vol. 14, no. 3, pp. 59-69, July-Sept. 1997, doi:10.1109/54.605998
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