|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
| | ||
| Search | ||
| ||
| ASCII Text | x | ||
| Des Farren, Tony Ambler, "The Economics of System-Level Testing," IEEE Design & Test of Computers, vol. 14, no. 3, pp. 51-58, July-September, 1997. | |||
| BibTex | x | ||
| @article{ 10.1109/54.605996, author = {Des Farren and Tony Ambler}, title = {The Economics of System-Level Testing}, journal ={IEEE Design & Test of Computers}, volume = {14}, number = {3}, issn = {0740-7475}, year = {1997}, pages = {51-58}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.605996}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - The Economics of System-Level Testing IS - 3 SN - 0740-7475 SP51 EP58 EPD - 51-58 A1 - Des Farren, A1 - Tony Ambler, PY - 1997 KW - Test Economics KW - System-Level Test KW - Event Rate Modeling KW - Process Optimization VL - 14 JA - IEEE Design & Test of Computers ER - | |||
Computer systems are becoming more complex and more difficult to test but, simultaneously, competitive pressure is mounting to streamline system level test without affecting customer quality. Despite efforts to improve the effectiveness of lower level test processes, system-level testing still cannot be eliminated as a manufacturing process stage and must, therefore, be recognized as a valid discipline. This is happening but it is a relatively immature field with technical and financial drivers hotly debated. Economic modeling can aid objective analysis and has already been used to identify cost effective alternatives for component and board test.
This article briefly describes a system-level test economic model and interprets some key results. As a prerequisite, the features unique to system-level test are identified and an event rate model is used to characterize system behavior during both production testing and early field run-time.

