This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Open Defects in CMOS RAM Address Decoders
April-June 1997 (vol. 14 no. 2)
pp. 26-33

Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects.

Citation:
Manoj Sachdev, "Open Defects in CMOS RAM Address Decoders," IEEE Design & Test of Computers, vol. 14, no. 2, pp. 26-33, April-June 1997, doi:10.1109/54.587738
Usage of this product signifies your acceptance of the Terms of Use.