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Issue No.02 - April-June (1997 vol.14)
pp: 26-33
ABSTRACT
<p>Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these hard-to-detect defects.</p>
CITATION
Manoj Sachdev, "Open Defects in CMOS RAM Address Decoders", IEEE Design & Test of Computers, vol.14, no. 2, pp. 26-33, April-June 1997, doi:10.1109/54.587738
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