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IEEE Design & Test of Computers
January-March 1997 (vol. 14 no. 1)
ISSN: 0740-7475
Table of Contents
EIC Message
Interview-Design data standard
News-JOLLY, BIST for embedded DRAM
News (Abstract)
pp. 7,90
Guest Editor's Introduction
Ultrasparc Testability
Memory Defect Mapping
Features
Special Features
A D&T Roundtable
Panel Summaries-Asynchronous design, Intranets and EDA
Panel Summaries (Abstract)
pp. 84-87
Conference Reports-ATS 96, System Test Standards Committee
DATC Newsletter
TTTC Newsletter
The Last Byte-Teaching George about test
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