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| Jacob M. Velixon, "Transmission Coefficient Correction for DACs," IEEE Design & Test of Computers, vol. 13, no. 4, pp. 34-39, Winter, 1996. | |||
| BibTex | x | ||
| @article{ 10.1109/54.544534, author = {Jacob M. Velixon}, title = {Transmission Coefficient Correction for DACs}, journal ={IEEE Design & Test of Computers}, volume = {13}, number = {4}, issn = {0740-7475}, year = {1996}, pages = {34-39}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.544534}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Transmission Coefficient Correction for DACs IS - 4 SN - 0740-7475 SP34 EP39 EPD - 34-39 A1 - Jacob M. Velixon, PY - 1996 KW - D/A converters KW - IC design KW - coefficient correction KW - IC test VL - 13 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.544534
Digital-to-analog converters have been known as the conversion devices from code to voltage for more than 20 years. Many of these converters, achieved as integrated circuits by CMOS and bipolar technologies, have a transmission coefficient error, often called full-scale error. In this article I used the general meaning of "value" and "error." The transmission error is defined by the deviation between resistances of the separate resistor r and the equivalent resistance of network Y - 2Y. This article presents some circuits for the transmission coefficient correction.
Index Terms:
D/A converters, IC design, coefficient correction, IC test
Citation:
Jacob M. Velixon, "Transmission Coefficient Correction for DACs," IEEE Design & Test of Computers, vol. 13, no. 4, pp. 34-39, Winter 1996, doi:10.1109/54.544534
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