This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
A D&T Roundtable: Deep-Submicron Test in cooperation with the Test Technology Technical Committee
Fall 1996 (vol. 13 no. 3)
pp. 102-108
Citation:
"A D&T Roundtable: Deep-Submicron Test in cooperation with the Test Technology Technical Committee," IEEE Design & Test of Computers, vol. 13, no. 3, pp. 102-108, Fall 1996, doi:10.1109/MDT.1996.10014
Usage of this product signifies your acceptance of the Terms of Use.