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Issue No.03 - Fall (1996 vol.13)
pp: 102-108
CITATION
"A D&T Roundtable: Deep-Submicron Test in cooperation with the Test Technology Technical Committee", IEEE Design & Test of Computers, vol.13, no. 3, pp. 102-108, Fall 1996, doi:10.1109/MDT.1996.10014
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