Issue No.03 - Fall (1996 vol.13)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.536099
An ever increasing demand for affordable on-chip fault-tolerance, the inherent unreliability attendant upon very large scale integration (VLSI), and the overwhelming complexity of fault-tolerance have elevated the automatic design of fault-tolerant VLSI systems into a research problem of immediate practical relevance. In this paper, we will outline (i) a flexible methodology for compiling an algorithmic description into an equivalent fault-tolerant VLSI IC subject to an application specific policy for fault-tolerance and (ii) a framework that embodies this methodology. The framework subsumes algorithms for synthesizing self-recovering, fault-secure, and reliable VLSI ICs from high-level algorithmic descriptions.
Fault-Tolerance, High Level Synthesis, CAD
Karin Hogstedt, Ramesh Karri, "Computer-Aided Design of Fault-Tolerant VLSI Systems", IEEE Design & Test of Computers, vol.13, no. 3, pp. 88-96, Fall 1996, doi:10.1109/54.536099