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Spanning the Product Life Cycle: RASSP DFT
Fall 1996 (vol. 13 no. 3)
pp. 32-42
This article describes a design for testability process, which is highly automated, hierarchical, and spans the entire life cycle. The process was developed for the DoD's RASSP Program and contributes significantly to the RASSP goals of 4x improvement in cycle time, design quality, and life cycle costs.
Index Terms:
BIST, design for testability, rapid prototyping, RASSP, signal processors, test strategy
Citation:
Richard M. Sedmak, John S. Evans, "Spanning the Product Life Cycle: RASSP DFT," IEEE Design & Test of Computers, vol. 13, no. 3, pp. 32-42, Fall 1996, doi:10.1109/54.536094
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