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Issue No.03 - Fall (1996 vol.13)
pp: 6,110-112
CITATION
Yervant Zorian, Tom Anderson, Yvon Savaria, Claude Thibeault, Andre Ivanov, "Panel Summaries", IEEE Design & Test of Computers, vol.13, no. 3, pp. 6,110-112, Fall 1996, doi:10.1109/MDT.1996.10018
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