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SCC20 attracts IEC participation
Spring 1996 (vol. 13 no. 1)
pp. 2
Citation:
John W. Sheppard, "SCC20 attracts IEC participation," IEEE Design & Test of Computers, vol. 13, no. 1, pp. 2, Spring 1996, doi:10.1109/MDT.1996.10000
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