Searching...
Advanced Search
Design&Test
1995
Issue No. 4 - Winter
This Publication
Digital Library
Advanced Search
This Publication
Subscribe to this Publication
Login to access your subscribed content
RSS feed for this Publication
Bibliographic References
ASCII Text
BibTex
RefWorks Procite/RefMan/EndNote
IEEE Design & Test of Computers
Winter 1995 (vol. 12 no. 4)
ISSN: 0740-7475
Table of Contents
News
News
(Abstract)
pp. 2-3
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Management Perspectives in EDA
The EDA Business Model Dialogue Part 2
(Abstract)
Ajit Prabhu
pp. 4-5,98-99
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Features
Guest Editor's Introduction: Multimedia Drives Changes
(HTML)
Frederick L. Kitson
pp. 6-7
ABSTRACT
PDF
HTML
Transitioning Desktops to Set Tops
(Abstract)
Frederick L. Kitson
Vasudev Bhaskaran
Devendra Kalra
pp. 8-17
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Simulating Multimedia Systems with MVPSIM
(Abstract)
Jihong Kim
Yongmin Kim
pp. 18-27
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Automatically Assessing MPEG Coding Fidelity
(Abstract)
Christian J. Van Den Branden Lambrecht
Vasudev Bhaskaran
Al Kovalick
Murat Kunt
pp. 28-33
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Testing Multimedia Transmission Systems
(Abstract)
David K. Fibush
pp. 34-44
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Special Features
Testing Defects in Scan Chains
(Abstract)
Manoj Sachdev
pp. 45-51
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Timing-Driven Partial Scan
(Abstract)
Jing-yang Jou
Kwang-ting (tim) Cheng
pp. 52-59
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
IDDQ Test and Diagnosis of CMOS Circuits
(Abstract)
Eugeni Isern
Joan Figueras
pp. 60-67
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Testing and Diagnosing Managed Networks
(Abstract)
Randall Mcree
pp. 68-80
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Special Report: Shared-I/O Scan Test
(Abstract)
Bulent I. Dervisoglu
pp. 81-83
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
A D&T Roundtable: Low-Power Design
(Abstract)
pp. 84-90
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE Design & Test of Computers Annual Index, Volume 12
(Abstract)
pp. 91-94
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Conference Reports
Conference Reports
(Abstract)
Sreejit Chakravarty
Ramalingam Sridhar
Shambhu Upadhyaya
Yervant Zorian
Gil Philips
B. Kaminska
B. Courtois
pp. 95-97
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
DATC Newsletter
Design Automation Technical Committee Newsletter
(Abstract)
pp. 100-101
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
TTTC Newsletter
Test Technology TC Newsletter
(Abstract)
pp. 102-103
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Peer Review Notice
|
Give Us Feedback
Usage of this product signifies your acceptance of the
Terms of Use
.
Open
Download
Print and Online Advertising Opportunities