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Special Report: Shared-I/O Scan Test
Winter 1995 (vol. 12 no. 4)
pp. 81-83

The IEEE P1149.2 standard seeks to implement several new features, such as shared-I/O cells, an optional parallel-update stage, and a high-impedance input pin. Although aspects of these features are incompatible with IEEE Std 1149.1, the working group strives to make P1149.2 consistent with the existing standard’s primary goals.

Citation:
Bulent I. Dervisoglu, "Special Report: Shared-I/O Scan Test," IEEE Design & Test of Computers, vol. 12, no. 4, pp. 81-83, Winter 1995, doi:10.1109/MDT.1995.473316
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