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Issue No.03 - Fall (1995 vol.12)
pp: 62-69
ABSTRACT
IDDQ testing has become a powerful tool for improving the quality of CMOS integrated circuits. One drawback of this testing is its speed--often compromising speed for accuracy, or vice versa. Given that a well-designed part will have a very low quiescent current, accuracy cannot be sacrificed; given that test time is perhaps the most expensive part of an IC's final cost, speed cannot be sacrificed. This article describes QuiC-Mon, a loadboard mounted circuit which is capable of offering both speed and accuracy--over 1-MHz measurement rates at sub-mA accuracy.
INDEX TERMS
IDDQ, ISSQ, current testing, QTAG, IC quality, QuiC-Mon
CITATION
Kenneth M. Wallquist, "Achieving IDDQ/ISSQ Production Testing with QuiC-Mon", IEEE Design & Test of Computers, vol.12, no. 3, pp. 62-69, Fall 1995, doi:10.1109/MDT.1995.466382
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