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Issue No.03 - Fall (1995 vol.12)
pp: 53-61
ABSTRACT
IDDQ testing is expected to make an important breakthrough as the mainstream CMOS test technology. However, before this happens it must be feasible to make at least a few hundred IDDQ measurements in the fleeting seconds of an IC's production test. QTAG is an initative to develop IDDQ test instrumentation for present ATE systems to solve this problem.
INDEX TERMS
Test technology, IDDQ testing, automatic test equipment systems
CITATION
Keith Baker, Alan Hales, "Plug-and-Play IDDQ Testing for Test Fixtures", IEEE Design & Test of Computers, vol.12, no. 3, pp. 53-61, Fall 1995, doi:10.1109/MDT.1995.466379
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