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Multiple Fault Diagnosis by Sensitizing Input Pairs
Fall 1995 (vol. 12 no. 3)
pp. 44-52
This article presents an efficient method for multiple fault diagnosis of combinational circuits by sensitizing input-pairs. The diagnostic process uses five deduction rules and a progressive deduction procedure to deduce suspected multiple faults in a circuit without probing internal lines, based on the responses observed at primary outputs by sensitizing input-pairs. The authors present a detailed example to demonstrate their method and experimental results to show the efficiency of the method.
Index Terms:
fault diagnosis, multiple stuck-at faults, sensitizing input-pairs, progressive deduction, combinational circuits
Citation:
Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu, "Multiple Fault Diagnosis by Sensitizing Input Pairs," IEEE Design & Test of Computers, vol. 12, no. 3, pp. 44-52, Fall 1995, doi:10.1109/MDT.1995.466375
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