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Issue No.03 - Fall (1995 vol.12)
pp: 44-52
ABSTRACT
This article presents an efficient method for multiple fault diagnosis of combinational circuits by sensitizing input-pairs. The diagnostic process uses five deduction rules and a progressive deduction procedure to deduce suspected multiple faults in a circuit without probing internal lines, based on the responses observed at primary outputs by sensitizing input-pairs. The authors present a detailed example to demonstrate their method and experimental results to show the efficiency of the method.
INDEX TERMS
fault diagnosis, multiple stuck-at faults, sensitizing input-pairs, progressive deduction, combinational circuits
CITATION
Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu, "Multiple Fault Diagnosis by Sensitizing Input Pairs", IEEE Design & Test of Computers, vol.12, no. 3, pp. 44-52, Fall 1995, doi:10.1109/MDT.1995.466375
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