|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
News
Fall 1995 (vol. 12 no. 3)
pp. 8-8
| ASCII Text | x | ||
| "News," IEEE Design & Test of Computers, vol. 12, no. 3, pp. 8-8, Fall, 1995. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1995.10024, author = {}, title = {News}, journal ={IEEE Design & Test of Computers}, volume = {12}, number = {3}, issn = {0740-7475}, year = {1995}, pages = {8-8}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1995.10024}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - News IS - 3 SN - 0740-7475 SP8 EP8 EPD - 8-8 PY - 1995 VL - 12 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"News," IEEE Design & Test of Computers, vol. 12, no. 3, pp. 8-8, Fall 1995, doi:10.1109/MDT.1995.10024
Usage of this product signifies your acceptance of the Terms of Use.