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Multifrequency Analysis of Faults in Analog Circuits
Summer 1995 (vol. 12 no. 2)
pp. 70-80
The deviation of defective components in analog circuits can be modeled in a continuous form. These deviations can be soft, large deviation, or hard faults. Observing these three kinds of faults for the same component is different from one kind of fault to another. Testability analysis in analog circuits in the presence of these three kinds of faults is an important task and a desirable approach for producing testable systems. The purpose of this article is to analyze these faults by observing their various symptoms at the output. The proposed approach offers the possibility of analyzing both soft and hard faults using the same test methodology. We study the testability of analog circuits in the frequency domain in the presence of these faults using the analog fault observability concept. The proposed algorithm indicates the set of adequate test frequencies and test nodes that increase fault observability. We then generate the test vectors that allow us to observe all these kinds of faults and to cover them. Some simulation and experimental results are provided to show the importance of the appropriate fault modeling technique and analysis.
Index Terms:
analog circuits, testability analysis, fault analysis, fault modeling
Citation:
Mustapha Slamani, Bozena Kaminska, "Multifrequency Analysis of Faults in Analog Circuits," IEEE Design & Test of Computers, vol. 12, no. 2, pp. 70-80, Summer 1995, doi:10.1109/54.386008
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