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Issue No.02 - Summer (1995 vol.12)
pp: 53-59
ABSTRACT
This article discusses the "state of the union" of the 1149.1 standard and celebrates the success of the IEEE 1149.1 standard while motivating some discussion and future action to encourage further development of boundary scan based testing. The point of view is that of the implementer in a competitive business environment.
INDEX TERMS
IEEE Std 1149.1, Boundary-Scan, Board Test, BIST, System Test
CITATION
Mick M.V. Tegethoff, Kenneth P. Parker, "IEEE Std 1149.1:Where Are We? Where From Here?", IEEE Design & Test of Computers, vol.12, no. 2, pp. 53-59, Summer 1995, doi:10.1109/54.386006
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