The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.02 - Summer (1995 vol.12)
pp: 42-52
ABSTRACT
A case study of the use of IDDQ testing in the design and testing of the Hewlett-Packard PA7100LC PA-RISC microprocessor. This 900, 000 transistor custom design supports IDDQ test to ensure high quality without compromising 100 MHz+ performance. Design guidelines, measurement techniques and results are presented.
INDEX TERMS
Microprocessor test, design for test, IDDQ testing
CITATION
Doug Josephson, Mark Storey, Dan Dixon, "Microprocessor IDDQ Testing: A Case Study", IEEE Design & Test of Computers, vol.12, no. 2, pp. 42-52, Summer 1995, doi:10.1109/54.386005
16 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool