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Issue No.03 - July/September (1994 vol.11)
pp: 28-38
CITATION
Meng-Lieh Sheu, Chung Len Lee, "Simplifying Sequential Circuit Test Generation", IEEE Design & Test of Computers, vol.11, no. 3, pp. 28-38, July/September 1994, doi:10.1109/MDT.1994.303845
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