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| Erwin Trischler, Mats Johansson, "Ten: A Concurrent Test Engineering Environment," IEEE Design & Test of Computers, vol. 11, no. 3, pp. 6-16, July/September, 1994. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1994.303843, author = {Erwin Trischler and Mats Johansson}, title = {Ten: A Concurrent Test Engineering Environment}, journal ={IEEE Design & Test of Computers}, volume = {11}, number = {3}, issn = {0740-7475}, year = {1994}, pages = {6-16}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1994.303843}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Ten: A Concurrent Test Engineering Environment IS - 3 SN - 0740-7475 SP6 EP16 EPD - 6-16 A1 - Erwin Trischler, A1 - Mats Johansson, PY - 1994 VL - 11 JA - IEEE Design & Test of Computers ER - | |||
Citation:
Erwin Trischler, Mats Johansson, "Ten: A Concurrent Test Engineering Environment," IEEE Design & Test of Computers, vol. 11, no. 3, pp. 6-16, July-Sept. 1994, doi:10.1109/MDT.1994.303843
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