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Issue No.02 - April/June (1994 vol.11)
pp: 64-73
ABSTRACT
<p>This implementation strategy enables incremental test of all system components, providing an alternative solution to the known good die testing problem. The authors present a simple microcontroller emulator designed and fabricated for study of the test logic needed as a key component of this method.</p>
CITATION
Derek B.I. Feltham, Anne E. Gattiker, Wojciech Maly, Kenneth Backus, Michael E. Thomas, "Smart-Substrate Multichip-Module Systems", IEEE Design & Test of Computers, vol.11, no. 2, pp. 64-73, April/June 1994, doi:10.1109/54.282446
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