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Smart-Substrate Multichip-Module Systems
April/June 1994 (vol. 11 no. 2)
pp. 64-73

This implementation strategy enables incremental test of all system components, providing an alternative solution to the known good die testing problem. The authors present a simple microcontroller emulator designed and fabricated for study of the test logic needed as a key component of this method.

Citation:
Wojciech Maly, Derek B.I. Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas, "Smart-Substrate Multichip-Module Systems," IEEE Design & Test of Computers, vol. 11, no. 2, pp. 64-73, April-June 1994, doi:10.1109/54.282446
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