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A Tutorial on Built-In Self-Test, Part 2: Applications
April/June 1993 (vol. 10 no. 2)
pp. 69-77

For pt.1 see ibid., vol.10, no.1, p.73-82 (1993). The hardware structures and tools used to implement built-in self-test (BIST) pattern generation and response analysis concepts are reviewed. The authors describe testing approaches for general and structured logic, including ROMs, RAMs, and PLAs. They illustrate BIST techniques with real-world examples.

Citation:
Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja, "A Tutorial on Built-In Self-Test, Part 2: Applications," IEEE Design & Test of Computers, vol. 10, no. 2, pp. 69-77, April-June 1993, doi:10.1109/54.211530
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