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Issue No.02 - April/June (1993 vol.10)
pp: 24-33
ABSTRACT
<p>A method of built-in self-diagnosis (BISD) for repairable, embedded static RAMs (SRAMs) is presented. The BISD circuit, with self-repair, requires about 5% extra area in a 64-kb SRAM. The circuit contains a small reduced-instruction-set processor, which executes diagnosis algorithms stored in a ROM. These algorithms employ hybrid serial/parallel operations when external repair is available or modular operations when self-repair is required. The algorithms, hardware design, and design costs and tradeoffs are discussed.</p>
CITATION
Robert Treuer, Vinod K. Agarwal, "Built-In Self-Diagnosis for Repairable Embedded RAMs", IEEE Design & Test of Computers, vol.10, no. 2, pp. 24-33, April/June 1993, doi:10.1109/54.211525
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