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Issue No.02 - April/June (1993 vol.10)
pp: 6-12
ABSTRACT
<p> Two testing techniques for ultra-large-scale integrated (ULSI) memories containing on-chip voltage downconverters (VDCs) are described. The first in an on-chip VDC tuning technique that adjusts internal V/sub CC/ to compensate for the monitored characteristics of the process parameters during repair analysis testing. The second is an operating-voltage margin test, performed at various internal V/sub CC/ levels during the water sort test (WT) and the final shipping test (FT).</p>
CITATION
Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima, "Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters", IEEE Design & Test of Computers, vol.10, no. 2, pp. 6-12, April/June 1993, doi:10.1109/54.211523
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