This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
A Tutorial on Built-in Self-Test. I. Principles
January/March 1993 (vol. 10 no. 1)
pp. 73-82

An overview of built-in self-test (BIST) principles and practices is presented. The issues and economics underlying BIST are discussed, and the related hierarchical test structures are introduced. The fundamental BIST concepts of pattern generation and response analysis are explained. Linear feedback shift register theory is reviewed.

Citation:
Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja, "A Tutorial on Built-in Self-Test. I. Principles," IEEE Design & Test of Computers, vol. 10, no. 1, pp. 73-82, Jan.-March 1993, doi:10.1109/54.199807
Usage of this product signifies your acceptance of the Terms of Use.