This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Applications of a Laser-Induced Plasma Pathway to Testing of Electronic Modules
January/March 1993 (vol. 10 no. 1)
pp. 67-72

The authors discuss further developments and experimental applications of an in situ noncontact testing (NCT) system for printed-wire boards (PWBs). The results demonstrate the system's ability to overdrive logic circuits using the signal injection, making it an excellent means for analyzing operating hardware without disruption. The results also indicate that the NCT probe can serve well as a low-cost front end for test systems already in service.

Citation:
Karl R. Umstadter, Don L. Millard, Robert C. Block, "Applications of a Laser-Induced Plasma Pathway to Testing of Electronic Modules," IEEE Design & Test of Computers, vol. 10, no. 1, pp. 67-72, Jan.-March 1993, doi:10.1109/54.199806
Usage of this product signifies your acceptance of the Terms of Use.