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Issue No.01 - January/March (1993 vol.10)
pp: 52-66
ABSTRACT
<p>The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed.</p>
CITATION
William R. Simpson, John W. Sheppard, "Fault Isolation in an Integrated Diagnostic Environment", IEEE Design & Test of Computers, vol.10, no. 1, pp. 52-66, January/March 1993, doi:10.1109/54.199805
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