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Fault Isolation in an Integrated Diagnostic Environment
January/March 1993 (vol. 10 no. 1)
pp. 52-66

The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed.

Citation:
William R. Simpson, John W. Sheppard, "Fault Isolation in an Integrated Diagnostic Environment," IEEE Design & Test of Computers, vol. 10, no. 1, pp. 52-66, Jan.-March 1993, doi:10.1109/54.199805
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