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Issue No.01 - January/March (1993 vol.10)
pp: 6-7
CITATION
Pinaki Mazumder, John P. Hayes, "Guest Editor's Introduction: Testing and Improving the Testability of Multimegabit Memories", IEEE Design & Test of Computers, vol.10, no. 1, pp. 6-7, January/March 1993, doi:10.1109/MDT.1993.10003
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