This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Citation:
Pinaki Mazumder, John P. Hayes, "Guest Editor's Introduction: Testing and Improving the Testability of Multimegabit Memories," IEEE Design & Test of Computers, vol. 10, no. 1, pp. 6-7, Jan.-March 1993, doi:10.1109/MDT.1993.10003
Usage of this product signifies your acceptance of the Terms of Use.