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Issue No.04 - October/December (1992 vol.9)
pp: 27-32
ABSTRACT
<p>A delay fault diagnosis process consisting of simulation of the fault-free circuit with a four-valued logic algebra and critical-path tracing from primary outputs to primary inputs is presented. An alternative to fault simulation, the method requires no delay-size-based fault models and considers only the fault-free circuit. A sensitivity analysis process for improving diagnosis accuracy is also presented.</p>
CITATION
Patrick Girard, Christian Landrault, Serge Pravossoudovitch, "Delay-Fault Diagnosis by Critical-Path Tracing", IEEE Design & Test of Computers, vol.9, no. 4, pp. 27-32, October/December 1992, doi:10.1109/54.173329
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