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Design&Test
1992
Issue No. 1 - January/March
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Bibliographic References
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IEEE Design & Test of Computers
January/March 1992 (vol. 9 no. 1)
ISSN: 0740-7475
Table of Contents
News
News
(Abstract)
pp. 3-4
ABSTRACT
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Features
Guest Editor's Introduction: Mixing Analog and Digital Systems
(PDF)
Mani Soma
pp. 6-7
ABSTRACT
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Techniques for Synthesis of Analog Integrated Circuits
(Abstract)
Brian A.A. Antao
Arthur J. Brodersen
pp. 8-18
ABSTRACT
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Fault Diagnosis in Analog Circuits Using Element Modulation
(Abstract)
Alvernon Walker
Winser E. Alexander
Parag K. Lala
pp. 19-29
ABSTRACT
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Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing
(Abstract)
Mustapha Slamani
Bozena Kaminska
pp. 30-39
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System Testability Assessment for Integrated Diagnostics
(Abstract)
William R. Simpson
John W. Sheppard
pp. 40-54
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Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway
(Abstract)
Don L. Millard
Karl R. Umstadter
Robert C. Block
pp. 55-63
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Advanced Fault Collapsing (Logic Circuits Testing)
(Abstract)
Antonio Lloy
pp. 64-71
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Empirical Failure Analysis and Validation of Fault Models in CMOS VLSI Circuits
(Abstract)
Ashish Pancholy
Janusz Rajski
Larry J. McNaughton
pp. 72-83
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A D&T Roundtable
(Abstract)
pp. 84-93
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Book Review
VLSI design
(Abstract)
pp. 95
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TTTC Newsletter
TTTC Newsletter
(Abstract)
pp. 100-101
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DATC Newsletter
DATC Newsletter
(Abstract)
pp. 102-103
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