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Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway
January/March 1992 (vol. 9 no. 1)
pp. 55-63

Systems using the three most popular probes applied to functional electrical testing, mechanical, electron beam, and laser, are reviewed. A system of noncontact testing that uses a laser-induced plasma 'switch' to provide the electrical pathway for AD and DC measurements on printed wiring boards is presented. With this technique, a DC resistance discrimination of less than 10 Omega and distortion-free AC measurements of a 2.5-MHz oscillator signal were achieved. These results are presented and evaluated.

Citation:
Don L. Millard, Karl R. Umstadter, Robert C. Block, "Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway," IEEE Design & Test of Computers, vol. 9, no. 1, pp. 55-63, Jan.-March 1992, doi:10.1109/54.124517
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