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Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway
January/March 1992 (vol. 9 no. 1)
pp. 55-63
ASCII Text
x 
 
Don L. Millard, Karl R. Umstadter, Robert C. Block, "Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway," IEEE Design & Test of Computers, vol. 9, no. 1, pp. 55-63, January/March, 1992.
 
 
BibTex
x
 
@article{ 10.1109/54.124517,
author = {Don L. Millard and Karl R. Umstadter and Robert C. Block},
title = {Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway},
journal ={IEEE Design & Test of Computers},
volume = {9},
number = {1},
issn = {0740-7475},
year = {1992},
pages = {55-63},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.124517},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway
IS - 1
SN - 0740-7475
SP55
EP63
EPD - 55-63
A1 - Don L. Millard,
A1 - Karl R. Umstadter,
A1 - Robert C. Block,
PY - 1992
VL - 9
JA - IEEE Design & Test of Computers
ER -
 

Systems using the three most popular probes applied to functional electrical testing, mechanical, electron beam, and laser, are reviewed. A system of noncontact testing that uses a laser-induced plasma 'switch' to provide the electrical pathway for AD and DC measurements on printed wiring boards is presented. With this technique, a DC resistance discrimination of less than 10 Omega and distortion-free AC measurements of a 2.5-MHz oscillator signal were achieved. These results are presented and evaluated.

Citation:
Don L. Millard, Karl R. Umstadter, Robert C. Block, "Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway," IEEE Design & Test of Computers, vol. 9, no. 1, pp. 55-63, Jan.-March 1992, doi:10.1109/54.124517
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