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Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing
January/March 1992 (vol. 9 no. 1)
pp. 30-39

An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.

Citation:
Mustapha Slamani, Bozena Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," IEEE Design & Test of Computers, vol. 9, no. 1, pp. 30-39, Jan.-March 1992, doi:10.1109/54.124515
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