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Issue No.01 - January/March (1992 vol.9)
pp: 30-39
ABSTRACT
<p>An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.</p>
CITATION
Mustapha Slamani, Bozena Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing", IEEE Design & Test of Computers, vol.9, no. 1, pp. 30-39, January/March 1992, doi:10.1109/54.124515
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