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Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing
January/March 1992 (vol. 9 no. 1)
pp. 30-39
| ASCII Text | x | ||
| Mustapha Slamani, Bozena Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," IEEE Design & Test of Computers, vol. 9, no. 1, pp. 30-39, January/March, 1992. | |||
| BibTex | x | ||
| @article{ 10.1109/54.124515, author = {Mustapha Slamani and Bozena Kaminska}, title = {Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing}, journal ={IEEE Design & Test of Computers}, volume = {9}, number = {1}, issn = {0740-7475}, year = {1992}, pages = {30-39}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.124515}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing IS - 1 SN - 0740-7475 SP30 EP39 EPD - 30-39 A1 - Mustapha Slamani, A1 - Bozena Kaminska, PY - 1992 VL - 9 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.124515
An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.
Citation:
Mustapha Slamani, Bozena Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," IEEE Design & Test of Computers, vol. 9, no. 1, pp. 30-39, Jan.-March 1992, doi:10.1109/54.124515
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