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Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing
October/December 1991 (vol. 8 no. 4)
pp. 39-51
| ASCII Text | x | ||
| Jochen Kolzer, Johann. Otto, "Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing," IEEE Design & Test of Computers, vol. 8, no. 4, pp. 39-51, October/December, 1991. | |||
| BibTex | x | ||
| @article{ 10.1109/54.107204, author = {Jochen Kolzer and Johann. Otto}, title = {Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing}, journal ={IEEE Design & Test of Computers}, volume = {8}, number = {4}, issn = {0740-7475}, year = {1991}, pages = {39-51}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.107204}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing IS - 4 SN - 0740-7475 SP39 EP51 EPD - 39-51 A1 - Jochen Kolzer, A1 - Johann. Otto, PY - 1991 VL - 8 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.107204
For pt.I. see ibid., vol.8, no.3, p.36-43 (1991). Contactless tools for testing inside dynamic RAMs, including hot-spot detection, emission microscopy, scanning laser microscopy, and submicron electron beam testing, are described. Basic principles and experimental setups are described. The utility of the techniques is assessed.
Citation:
Jochen Kolzer, Johann. Otto, "Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing," IEEE Design & Test of Computers, vol. 8, no. 4, pp. 39-51, Oct.-Dec. 1991, doi:10.1109/54.107204
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