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Issue No.03 - July/September (1991 vol.8)
pp: 44-48
ABSTRACT
<p>A variable slew rate, together with the ability to control ascending and descending slew rates independently, significantly improves the overall accuracy of test and verification systems for application-specific ICs. Although a high slew rate is usually desirable, in some cases, such as ECL devices and devices in circuits of older vintage, a variable rate is advantageous. Essential driver characteristics are identified, and the driver model is described. For a small parts cost, and with only a negligible increase in power requirements, it is estimated that independent control of slew rates for ascending and descending edges can improve tester accuracy by several hundred picoseconds.</p>
CITATION
Bjorn Dahlberg, "Increasing Test Accuracy by Varying Driver Slew Rate", IEEE Design & Test of Computers, vol.8, no. 3, pp. 44-48, July/September 1991, doi:10.1109/54.84243
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