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Increasing Test Accuracy by Varying Driver Slew Rate
July/September 1991 (vol. 8 no. 3)
pp. 44-48

A variable slew rate, together with the ability to control ascending and descending slew rates independently, significantly improves the overall accuracy of test and verification systems for application-specific ICs. Although a high slew rate is usually desirable, in some cases, such as ECL devices and devices in circuits of older vintage, a variable rate is advantageous. Essential driver characteristics are identified, and the driver model is described. For a small parts cost, and with only a negligible increase in power requirements, it is estimated that independent control of slew rates for ascending and descending edges can improve tester accuracy by several hundred picoseconds.

Bjorn Dahlberg, "Increasing Test Accuracy by Varying Driver Slew Rate," IEEE Design & Test of Computers, vol. 8, no. 3, pp. 44-48, July-Sept. 1991, doi:10.1109/54.84243
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