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System Complexity and Integrated Diagnostics
July/September 1991 (vol. 8 no. 3)
pp. 16-30
ASCII Text
x 
 
William R. Simpson, John W. Sheppard, "System Complexity and Integrated Diagnostics," IEEE Design & Test of Computers, vol. 8, no. 3, pp. 16-30, July/September, 1991.
 
 
BibTex
x
 
@article{ 10.1109/54.84239,
author = {William R. Simpson and John W. Sheppard},
title = {System Complexity and Integrated Diagnostics},
journal ={IEEE Design & Test of Computers},
volume = {8},
number = {3},
issn = {0740-7475},
year = {1991},
pages = {16-30},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.84239},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - System Complexity and Integrated Diagnostics
IS - 3
SN - 0740-7475
SP16
EP30
EPD - 16-30
A1 - William R. Simpson,
A1 - John W. Sheppard,
PY - 1991
VL - 8
JA - IEEE Design & Test of Computers
ER -
 

An overview of a complete approach to integrated diagnostics is given. The approach is centered around an information-flow model and incorporates techniques from information fusion and artificial intelligence to guide analyses. The concept of integrated diagnosis is explained, and the model is examined. The authors show how to analyze testability, evaluate fault diagnosis, and create maintenance aids.

Citation:
William R. Simpson, John W. Sheppard, "System Complexity and Integrated Diagnostics," IEEE Design & Test of Computers, vol. 8, no. 3, pp. 16-30, July-Sept. 1991, doi:10.1109/54.84239
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