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Issue No.03 - July/September (1991 vol.8)
pp: 16-30
ABSTRACT
<p>An overview of a complete approach to integrated diagnostics is given. The approach is centered around an information-flow model and incorporates techniques from information fusion and artificial intelligence to guide analyses. The concept of integrated diagnosis is explained, and the model is examined. The authors show how to analyze testability, evaluate fault diagnosis, and create maintenance aids.</p>
CITATION
William R. Simpson, John W. Sheppard, "System Complexity and Integrated Diagnostics", IEEE Design & Test of Computers, vol.8, no. 3, pp. 16-30, July/September 1991, doi:10.1109/54.84239
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