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A Rapid-Prototyping Environment for Digital-Signal Processors
April/June 1991 (vol. 8 no. 2)
pp. 11-25

A description is given of the Diodes system, a complete rapid prototyping, debugging, and test environment including both hardware and software, for the design of digital-signal-processing chips. The test circuitry in Diodes differs from that in many systems, including those based on boundary scan, by offering full-speed circuit testing and the observation of internal nodes during real time. Diodes also achieves nearly 100% fault coverage because chips are composed of numerous chunks, each of which is tested exhaustively. The discussion covers the high-density interconnection technology and the concepts on which Diodes is based, two types of chips that have been designed, fabricated, and tested for Diodes: module assembly and fabrication; synthesis software; on-chip testing; Diodes test circuitry; test modes; and hardware and software debugging. Diodes is compared with other testing approaches and other rapid prototyping systems.

Richard Hartley, Kenneth Welles II, Michael Hartman, Abhjit Chatterjee, Paul Delano, Barbara Molnar, Colin Rafferty, "A Rapid-Prototyping Environment for Digital-Signal Processors," IEEE Design & Test of Computers, vol. 8, no. 2, pp. 11-25, April-June 1991, doi:10.1109/54.82035
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