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Issue No.01 - January/March (1991 vol.8)
pp: 21-34
ABSTRACT
<p>A two-value, zero-delay simulator that computes signatures and analyzes fault coverage for circuits with built-in self-test (BIST) is described. The simulator, called the compiled logic simulator (CLS), is used with a monitor that simulates BIST control logic at a high level. The simulator's compiled code is well suited to the IBM 3090 pipeline and fault simulation using flat random patterns. The linear-feedback-shift-register simulation monitor is discussed. Performance results are presented. Fault simulation with one million random patterns on a 40000-gate circuit was done in 16 CPU minutes.</p>
CITATION
Brion Keller, David P. Carlson, William Maloney, "The Compiled Logic Simulator", IEEE Design & Test of Computers, vol.8, no. 1, pp. 21-34, January/March 1991, doi:10.1109/54.75660
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