|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
| | ||
| Search | ||
| ASCII Text | x | ||
| "D&T News," IEEE Design & Test of Computers, vol. 7, no. 6, pp. 5-7, 41, November/December, 1990. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1990.10024, author = {}, title = {D&T News}, journal ={IEEE Design & Test of Computers}, volume = {7}, number = {6}, issn = {0740-7475}, year = {1990}, pages = {5-7, 41}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1990.10024}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - D&T News IS - 6 SN - 0740-7475 SP5 EP7, 41 EPD - 5-7, 41 PY - 1990 VL - 7 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"D&T News," IEEE Design & Test of Computers, vol. 7, no. 6, pp. 5-7, 41, Nov.-Dec. 1990, doi:10.1109/MDT.1990.10024
Usage of this product signifies your acceptance of the Terms of Use.

