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Issue No.04 - July/August (1990 vol.7)
pp: 32-35
ABSTRACT
<p>In the text, Test Generation for VLSI Chips (see IEEE Computer Society Press, 1988), V. Agrawal and S. Seth gave a formula for estimating fault coverage from the coverage analysis of randomly sampled faults that contains an error. A corrected formula for the sample size required for a given error tolerance in the measurement of fault coverage is given. Easy-to-use guidelines for analyzing fault coverage are presented.</p>
CITATION
Vishwani D. Agrawal, Hatsuyoshi Kato, "Fault Sampling Revisited", IEEE Design & Test of Computers, vol.7, no. 4, pp. 32-35, July/August 1990, doi:10.1109/54.57911
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