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Fault Sampling Revisited
July/August 1990 (vol. 7 no. 4)
pp. 32-35

In the text, Test Generation for VLSI Chips (see IEEE Computer Society Press, 1988), V. Agrawal and S. Seth gave a formula for estimating fault coverage from the coverage analysis of randomly sampled faults that contains an error. A corrected formula for the sample size required for a given error tolerance in the measurement of fault coverage is given. Easy-to-use guidelines for analyzing fault coverage are presented.

Citation:
Vishwani D. Agrawal, Hatsuyoshi Kato, "Fault Sampling Revisited," IEEE Design & Test of Computers, vol. 7, no. 4, pp. 32-35, July-Aug. 1990, doi:10.1109/54.57911
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