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| ASCII Text | x | ||
| "D&T News," IEEE Design & Test of Computers, vol. 7, no. 4, pp. 2-3, 76, July/August, 1990. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1990.10014, author = {}, title = {D&T News}, journal ={IEEE Design & Test of Computers}, volume = {7}, number = {4}, issn = {0740-7475}, year = {1990}, pages = {2-3, 76}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1990.10014}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - D&T News IS - 4 SN - 0740-7475 SP2 EP3, 76 EPD - 2-3, 76 PY - 1990 VL - 7 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"D&T News," IEEE Design & Test of Computers, vol. 7, no. 4, pp. 2-3, 76, July-Aug. 1990, doi:10.1109/MDT.1990.10014
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