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Low-Cost Testing of High-Density Logic Components
March/April 1990 (vol. 7 no. 2)
pp. 15-28
ASCII Text
x 
 
Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick Jr., Donald L. Wheater, "Low-Cost Testing of High-Density Logic Components," IEEE Design & Test of Computers, vol. 7, no. 2, pp. 15-28, March/April, 1990.
 
 
BibTex
x
 
@article{ 10.1109/54.53042,
author = {Robert W. Bassett and Barry J. Butkus and Stephen L. Dingle and Marc R. Faucher and Pamela S. Gillis and Jeannie H. Panner and John G. Petrovick Jr. and Donald L. Wheater},
title = {Low-Cost Testing of High-Density Logic Components},
journal ={IEEE Design & Test of Computers},
volume = {7},
number = {2},
issn = {0740-7475},
year = {1990},
pages = {15-28},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.53042},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Low-Cost Testing of High-Density Logic Components
IS - 2
SN - 0740-7475
SP15
EP28
EPD - 15-28
A1 - Robert W. Bassett,
A1 - Barry J. Butkus,
A1 - Stephen L. Dingle,
A1 - Marc R. Faucher,
A1 - Pamela S. Gillis,
A1 - Jeannie H. Panner,
A1 - John G. Petrovick Jr.,
A1 - Donald L. Wheater,
PY - 1990
VL - 7
JA - IEEE Design & Test of Computers
ER -
 

The evolution of a testing method and architecture of a logic-device tester to be used for the next generation of IBM's high-density CMOS ASIC (application-specific integrated circuit) logic components is described. The tester's design is based on the architecture of an existing IBM memory tester rather than on a conventional logic-tester design. The testing strategy calls for boundary-scan in each component design, built-in self-test logic within embedded memory arrays, and the use of weighted random-pattern logic testing. The development of the tester hardware is discussed, and capital costs of the new tester are compared with those of other approaches.

Citation:
Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick Jr., Donald L. Wheater, "Low-Cost Testing of High-Density Logic Components," IEEE Design & Test of Computers, vol. 7, no. 2, pp. 15-28, March-April 1990, doi:10.1109/54.53042
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