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Issue No.02 - March/April (1990 vol.7)
pp: 4-14
ABSTRACT
<p>A 10-V pin electronics driver that can output signals with low distortion and fast risetimes for both narrow and wide voltage swings is described. The features combine to eliminate the need for dual drivers, pin cards, or test heads, which simplifies the testing of mixed-technology devices or modules. A high-voltages process module has been added to a standard 1.5- mu m digital CMOS process, which allows the driver to be in the same silicon as the timing and formatting circuitry. Design and calibration techniques that overcome the limitations of the high-voltage CMOS process are examined.</p>
CITATION
Christopher W. Branson, "Integrating Tester Pin Electronics", IEEE Design & Test of Computers, vol.7, no. 2, pp. 4-14, March/April 1990, doi:10.1109/54.53041
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