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| ASCII Text | x | ||
| M.R. Mercer, "Guest Editorial: ITC 20th Anniversary," IEEE Design & Test of Computers, vol. 7, no. 2, pp. 2-3, March/April, 1990. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1990.10008, author = {M.R. Mercer}, title = {Guest Editorial: ITC 20th Anniversary}, journal ={IEEE Design & Test of Computers}, volume = {7}, number = {2}, issn = {0740-7475}, year = {1990}, pages = {2-3}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1990.10008}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Guest Editorial: ITC 20th Anniversary IS - 2 SN - 0740-7475 SP2 EP3 EPD - 2-3 A1 - M.R. Mercer, PY - 1990 VL - 7 JA - IEEE Design & Test of Computers ER - | |||
Citation:
M.R. Mercer, "Guest Editorial: ITC 20th Anniversary," IEEE Design & Test of Computers, vol. 7, no. 2, pp. 2-3, March-April 1990, doi:10.1109/MDT.1990.10008
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