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Design&Test
1989
Issue No. 5 - September/October
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IEEE Design & Test of Computers
September/October 1989 (vol. 6 no. 5)
ISSN: 0740-7475
Table of Contents
Letters
Letters
(Abstract)
pp. 2
ABSTRACT
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D&T News
D&T News
(Abstract)
pp. 2
ABSTRACT
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Research Reviews
Research Reviews
(Abstract)
pp. 4
ABSTRACT
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Features
Design and Test in Asia: More to Sample
(Abstract)
pp. 6-7
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DFT Expert: Designing Testable VLSI Circuits
(Abstract)
Sudipta Bhawmik
P. Palchaudhuri
pp. 8-19
ABSTRACT
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A Data Structure for Fast Region Searches
(Abstract)
Y.S. Kuo
S.-Y. Hwang
H.F. Hu
pp. 20-28
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VLSI Design and CAD Technology in Korea
(Abstract)
Young-Uk Yu
pp. 29-39
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Logic Simulation Engines in Japan
(Abstract)
Shigeru Takasaki
Fumiyaki Hirose
Akihiko Yamada
pp. 40-49
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Ideas: A Tool for VLSI CAD
(Abstract)
A. Kumar
V. Kashyap
S.D. Sherlekar
G. Venkatesh
S. Biwas
A. Kumar
P.C.P. Bhatt
S. Kumar
pp. 50-57
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Test Counting: A Tool for VLSI Testing
(Abstract)
Sheldon B. Akers
Balakrishnan Krishnamurthy
pp. 58-77
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