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A D&T Roundtable: Built-In Self-Testmdash;Are Expectations too High?
May/June 1989 (vol. 6 no. 3)
pp. 66-74
Citation:
"A D&T Roundtable: Built-In Self-Testmdash;Are Expectations too High?," IEEE Design & Test of Computers, vol. 6, no. 3, pp. 66-74, May-June 1989, doi:10.1109/MDT.1989.10011
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