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Issue No.03 - May/June (1989 vol.6)
pp: 66-74
CITATION
"A D&T Roundtable: Built-In Self-Testmdash;Are Expectations too High?", IEEE Design & Test of Computers, vol.6, no. 3, pp. 66-74, May/June 1989, doi:10.1109/MDT.1989.10011
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