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| ASCII Text | x | ||
| "D&T News," IEEE Design & Test of Computers, vol. 6, no. 3, pp. 4, 76-80, May/June, 1989. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1989.10010, author = {}, title = {D&T News}, journal ={IEEE Design & Test of Computers}, volume = {6}, number = {3}, issn = {0740-7475}, year = {1989}, pages = {4, 76-80}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1989.10010}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - D&T News IS - 3 SN - 0740-7475 SP4, 76 EP80 EPD - 4, 76-80 PY - 1989 VL - 6 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"D&T News," IEEE Design & Test of Computers, vol. 6, no. 3, pp. 4, 76-80, May-June 1989, doi:10.1109/MDT.1989.10010
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